04734578 is referenced by 107 patents and cites 7 patents.

A scanning type optical microscope comprising a pair of light deflectors disposed between a laser light source and an objective lens for performing two-dimensional scanning of an object requiring observation by varying the incidence angle of a light entering the objective lens, and a pair of split detectors receiving a light coming from said object, wherein the light deflectors are disposed at the position of the pupil of the objective lens or at a position conjugate therewith or in their vicinity. This microscope has a high resolving power and allows an easy performance of a special microscopy and is convenient to handle. The paired detectors are arranged to be rotatable about an optical axis and allows free alteration of the orientation of differentiation of the differential observation image. A light-blocking plate can be provided within the detecting optical system for removing O-order diffraction light contained in the detection light, whereby permitting dark field microscopy at a very low cost.

Title
Two-dimensional scanning photo-electric microscope
Application Number
6/844167
Publication Number
4734578
Application Date
March 26, 1986
Publication Date
March 29, 1988
Inventor
Yoshiaki Horikawa
Hachiouji
JP
Agent
Cushman Darby & Cushman
Assignee
Olympus Optical
JP
IPC
G01N 21/00
View Original Source