04733172 is referenced by 44 patents and cites 4 patents.

An improved test probe card for testing unpackaged integrated-circuit (IC) chips prior to installation of the chips in some type of electronic device. The test probe card includes a chip insulating board having openings at positions corresponding to contact areas of an IC chip and a test circuit board having inner contact areas at positions corresponding to the openings in the chip insulating board. Electrical connections between the IC chip and inner circuit board contact areas are established with conductive connector elements positioned in the openings. Circuit board traces electrically connect the inner circuit board contact areas with outer contact areas located about the periphery of the circuit board. The outer contact areas are preferably connected to a testing device using coaxial cables, which are electrically connected to the outer contact areas with a coaxial cable connecting board. The connector elements are preferably each formed from a single strand of metal wire, each strand being wadded together to form a nearly cylindrical "button" of material.

Title
Apparatus for testing I.C. chip
Application Number
835818
Publication Number
4733172
Application Date
December 15, 1986
Publication Date
March 22, 1988
Inventor
Robert Smolley
Porteuguese Bend
CA, US
Agent
Robert J Stern
Sol L Goldstein
James M Steinberger
Assignee
TRW
CA, US
IPC
G01R 31/02
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