04606025 is referenced by 33 patents and cites 7 patents.

A system for automatically testing a plurality of memory arrays on selected memory array testers includes an interactive data entry device for entering array test specifications including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator generates a tester independent universal language instruction sequence for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a universal language translator which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester. The tester dependent instruction sequence may be loaded into the associated tester to produce the test signals for testing the memory array.

Title
Automatically testing a plurality of memory arrays on selected memory array testers
Application Number
6/536597
Publication Number
4606025
Application Date
September 28, 1983
Publication Date
August 12, 1986
Inventor
Louis J Vidunas
Wappingers Falls
NY, US
Henri D Schnurmann
Monsey
NY, US
Robert M Peters
Wappingers Falls
NY, US
Agent
Robert J Haase
Assignee
International Business Machines
NY, US
IPC
G06F 31/28
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