04553225 is referenced by 44 patents and cites 10 patents.

In a method of testing IC memories, at first, predetermined data such as all "0" or all "1" is written into an IC memory at a normal-operation power-supply voltage, and the written data is read out and confirmed. Next, the power-supply voltage is lowered and is then returned to the normal-operation power-supply voltage after a predetermined period of time has passed in order to determine whether the stored data is in agreement with the data as initially written. When the stored data is in agreement with the initially written data, the power-supply voltage is further lowered to repeat the above-mentioned procedure. The above-mentioned procedure is further repeated when the stored data is in agreement with the initially written data and a minimum data-holding limit voltage which is capable of holding the written data is thereby determined.

Title
Method of testing IC memories
Application Number
6/423645
Publication Number
4553225
Application Date
September 27, 1982
Publication Date
November 12, 1985
Inventor
Yoshikazu Ohe
Kawasaki
JP
Agent
Staas & Halsey
Assignee
Fujitsu
JP
IPC
G11C 29/00
G11C 11/40
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