04423376 is referenced by 70 patents and cites 2 patents.

An electrical probe assembly with rotatable probe elements for establishing electrical contact to pad surfaces having a plurality of elongated probe elements formed of a conductive flexible material, each having a length many times its diameter, spaced upper and lower flat support elements having apertures receiving the ends of the probe elements and maintaining the probe elements in a generally parallel arrangement with at least the lower ends in a configuration corresponding to the pad configuration to be contacted, and a means to simultaneously rotate the probe elements.

Title
Contact probe assembly having rotatable contacting probe elements
Application Number
6/245818
Publication Number
4423376
Application Date
March 20, 1981
Publication Date
December 27, 1983
Inventor
Richard Wahl
Fishkill
NY, US
Herbert P Byrnes
Poughkeepsie
NY, US
Agent
Wolmar J Stoffel
Assignee
International Business Machines Corporation
NY, US
IPC
G01R 31/02
G01R 1/06
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