2002-245723 is referenced by 64 patents.

PROBLEM TO BE SOLVED: To reproduce defect management information from a defect management area in time shorter than the time required by a conventional defect information reproducing method by eliminating the track jump of the program searching of the defect management area generated at the time of reproducing the defect management information from a plurality of adjacent defect management areas.SOLUTION: A defect list for reproducing the defect management information from the defect management area is provided and the defect list is registered to a primary defect list to which the address of a defect found at the time of initialization is registered (step 21). Or, it is registered to a secondary defect list to which the address of the defect found while recording information and the alternating address are registered. By using the primary defect list or the secondary defect list, the defect management information is simultaneously reproduced from a plurality of the adjacent defect management areas (step 3).

Title
Defect management information reproducing method
Application Number
2001-041328
Publication Number
2002-245723
Application Date
February 19, 2001
Publication Date
August 30, 2002
Inventor
Kato Satoshi
Assignee
Matsushita Electric
IPC
G11B 20/10
G11B 07/004
G11B 20/12