PURPOSE: To make it possible to verify functions of an integrated circuit even in a simple pass fail deciding device or even for integrated circuits forced to test under mixed conditions of passes and fails by enabling tests even when an expected value of a test is either pass or fail. CONSTITUTION: In a coincidence circuit 12, response outputs O from a tested integrated circuit IC are compared successively with a predefined expected value E of a response output, and the number of coincidence outputs A1 from the circuit 12 is counted in a counter circuit 13, and when the count in the circuit 12 is finished, counted number P of passes is compared with a predefined expected value PE of passes in a count comparing circuit 14. Where, when the counted value P and the expected value PE is coincident with each other, the count comparing circuit 14 outputs a count comparing output C1. Then a deciding resistor 15 decides that the tested integrated circuit IC is non- defective, and outputs a synthetic decision output Tj.

Pass fall deciding device for integrated circuit
Application Number
Publication Number
Application Date
December 12, 1991
Publication Date
June 29, 1993
Kuramoto Fumio
G01R 31/28