A programmable gate structure (20) having functionally redundant architeture for enhanced production yields and reliability comprises a plurality of two-input nodes (10) at least some of which may be programmed by control states (24, 26 and 28) for changing the logical function of the gate structure. Redundancy is provided by gate structure implementations in which the number of possible control states exceed the number of logic functions expected of the gate structure. Redundancy increases the probability of gate structure operation despite logic faults and renders the gate structure suitable for reprogramming in response to detected faults to achieve a desired gate function. A number of embodiments are disclosed including selected architectural simplifications wherein certain nodes in a network are logically fixed to reduce the number of control lines.; Illustrative computer programs for generating the proper control line signals for a selected gate function in such embodiments are disclosed.